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  1. MATERIALS DIAGNOSTICS PAGE

    MATERIALS DIAGNOSTICS, the company providing service for the low energy (20 keV to 400 keV) and high energy (400 keV to 4.2 MeV) Ion Implantation of Metals, ...
    imaging2
    semiconductor2
    ion2
    wafer1
    doping1
    Rutherford1
    microelectronics1
    RBS1
    chemical analysis1
    Spectrometry1
    Surface Analysis1
    impurities1
    Ion Implantation1
    particle accelerator1
    material characterization1
    monolayer1
    Backscattering1
    contamination analysis1
    dopant1
    Ion Beam Analysis1
    PIXE1
    Analysis of Thin Films0
    Fluorine Profiling0
    hydrogen profiling0
    Ion Beam Modification0
    Ion beams0
    mapping with microbeam0
    microbeam analysis0
    Nuclear Reaction Analysis0
    SIMS Standards0

    www.materialsdiagnostics.com - 2009-02-05

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